Characterization and Manipulation at Nanometer Scale

 

Lecturer: Prof. Chia-Seng Chang   (±i¹Å¤É±Ð±Â)

Outline: Class Note

Week 1 (2/27) Overview
Week 2 (3/06) No class
Week 3 (3/13) STM: structure and working principles
Week 4 (3/20) AFM: structure and working principles
Week 5 (3/27) SPM: structure and working principles
Week 6 (4/03) TEM: structure and working principles
Week 7 (4/10) TEM: operations and examples
Week 8 (4/17) Midterm Written Exam (50%)
Key for Midterm Exam
Week 9 (4/24) Spectroscopy: optical, electronic, vibrational
Week10 (5/01) Lithography: optical, e-beam
Week11 (5/08) Atom manipulation
Week12 (5/15)
Cancelled
¡° Papers study
Paper 1:
Paper 2: McEuen
Paper 3:


Presenter:
Week13 (5/22) ¡° Papers study
Paper 1: Graphene
Paper 2: Zettl
Paper 3: Rugar

Presenter: Sharma
Presenter: Hsieh
Presenter: Li
Week14 (5/29) ¡° Papers study
Paper 1: Hansma
Paper 2: Electrowetting

Presenter: Hsiao
Presenter: Jih
Week15 (6/05)

¡° Papers study
Paper 1: Gwo
Paper 2: Morita
Paper 3: Zewail


Presenter: Xu
Presenter: Wong
Presenter: Lin
Week16 (6/12) ¡° Papers study
Paper 1: Wilson Ho
Paper 2: Yazdani

Presenter: Chen
Presenter: Wang C. H.
Week17 Presentation and responses (50%)
Semester Final Score

Class Notes:

Feb 27, 2007 Nanoscale Measurements
Mar 13, 2007 STM
Mar 20, 2007 AFM
Mar 27, 2007 SPM
Apr 03, 2007

EM (1)
DigitalMicrograph Usage
Way of Finding Masking Tool in DigitalMicrograph
DigitalMicrograph365Demo

Apr 10, 2007 EM (2)
Apr 24, 2007 Spectroscopy
May 1, 2007 E-beam Lithography
May 8, 2007 Manipulation

Papers Study:

1.
Boersch
2.
Chiu
3.
Gwo
4.
McEuen
5.
Morita
6.
Rugar
7.
Wilson Ho
8.
Yazdani
9.
Zettl
10.
Electrowetting
11.
Graphene
12.
Zewail
13.
Hansma

 

 

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