X-ray 2 (X'Pert PRO)

1. 儀器全名：X光粉末繞射儀 (型號：X'Pert PRO)
2. 服務簡介：利用X光測定已知或未知物的結構，可用於粉末、塊材及薄膜鑑定，其X-ray光源為銅靶 (Kα；λ= 0.154 nm)，一般分析試片取樣規格為粉末，平鋪於沒有背景值得矽基板，以測得良好的θ-2θ的X 射線衍射譜圖，並使用分析軟體HighScore Plus進行分析，可得出材料晶體的排列結構、晶體排列、和晶粒大小。
3. 儀器規格：
   • 樣品性質：粉末、塊材、薄膜
   • 樣品數量：粉末體積多於0.5 mL，薄膜及塊材大於 2cm x 2cm
   • 操作時電壓電流：45KV 40mA
   • 掃描範圍：2θ, Range：5˚~100˚ (低或高於此角度，需與管理者討論)
   • 溫度範圍：室溫
4. 收費標準：360 NTD/1hr

1. Instrument: X'Pert PRO
2. Service: Use X-ray to determine the structure of substances of powders, bulk, and thin-film materials. The wavelength of the x-ray light source is λ~ 0.154 nm, which serves for x-ray diffraction analysis and can be used to analyze the crystal structure, crystal arrangement, and grain size of the material.
3. Instrument properties:
   • Acceptable sample: powder, bulk, and thin-film
   • Sample amount: Powder and Bulk Volume: above 0.5 mL / Thin film size: larger than 2cm x 2cm
   • Working Voltage and Current: 45 kV, 40 mA
   • Scanning Range: 2θ Range：5 ~ 100 Degree
   • Working Temperature: room environment
4. Charge: NTD 360/hour