X-ray 1 (Empyrean)

1. 儀器全名：X光粉末繞射儀 (型號：Empyrean)
2. 服務簡介：利用X光測定已知或未知物的結構，可用於粉末、塊材及薄膜鑑定，其X-ray光源為銅靶 (Kα；λ= 0.154 nm)，一般分析試片取樣規格為粉末，平鋪於沒有背景值得矽基板，以測得良好的θ-2θ的X 射線衍射譜圖，並使用分析軟體HighScore Plus進行分析，可得出材料晶體的排列結構、晶體排列、和晶粒大小。型號Empyrean偵測器獲取訊號時間為X'pert Pro的一半時間，並且可做變溫量測，其溫度範圍為室溫至攝氏427度。
3. 儀器規格：
   • 樣品性質：粉末、塊材、薄膜
   • 樣品數量：粉末體積多於0.5 mL，薄膜及塊材大於 2cm x 2cm
   • 操作時電壓電流：45KV 40mA
   • 掃描範圍：2θ, Range：5˚~100˚ (低或高於此角度，需與管理者討論)
   • 溫度範圍：室溫至攝氏427度 (Empyrean)
4. 收費標準：720 NTD/1hr

1. Instrument: X-Ray Powder Diffractometer
2. Service: Use X-ray to determine the structure of substances of powders, bulk, and thin-film materials. The wavelength of the x-ray light source is λ~ 0.154 nm, which serves for x-ray diffraction analysis and can be used to analyze the crystal structure, crystal arrangement, and grain size of the material. Model Empyrean detector takes signal efficiently and can measure variable temperatures ranging from room environment to 427 Celsius.
3. Instrument properties:
   • Acceptable sample: powder, bulk, and thin-film
   • Sample amount: Powder and Bulk Volume: above 0.5 mL / Thin film size: larger than 2cm x 2cm
   • Working Voltage and Current: 45 kV, 40 mA
   • Scanning Range: 2θ Range：5 ~ 100 Degree
   • Working Temperature: Room temperature to 427 Celsius
4. Charge: NTD 720/hour