反射式勞厄散射儀 (型號:IPX-YGR-LC)

• Instrument Manager 儀器負責人：
• Min-Nan Ou 歐敏男 /oumn[at]gate.sinica.edu.tw / 02-2789-8991

• Instrument Keeper 儀器管理員：
  • Yi-Jia Tsai 蔡益嘉 / aga963715818[at]gmail.com / 02-2789-8401 / (Office: P1A)
  • R.K. / vkranganayakulu66[at]gmail.com / 02-2789-8361
  • Sidharth duraisamy / dsidharth2022[at]gmail.com / 02-2789-8361

• 本設施設立目的為服務中央研究院物理所研究相關之工作。
• 使用者須經過本實驗室安全訓練與儀器操作訓練，取得操作執照。
• 使用反射式勞厄散射儀之人員具有輻射環境安全訓練證明。

1. 儀器全名：反射式勞厄散射儀 (型號:IPX-YGR-LC)
2. 儀器簡介：本儀器為反射式勞厄散射儀，藉由分析X光經樣品表面反射形成之繞射圖樣可推測晶體結構與結晶品質，適用於針對晶體材料的結晶品質進行初步鑑定，與SingleCrystal軟體配合可獲得晶軸方向與結晶織構等晶體結晶資訊。
3. 儀器規格：
   • 環境：大氣壓、室溫
   • 樣品型態：塊材
   • 影像版尺寸：8 cm x 12 cm
   • 光束直徑：0.5 mm
4. 收費標準：無須收費

• Purpose: The establishment of this facility aims to support research endeavors undertaken by the Institute of Physics, Academia Sinica.
• Operational Guidelines: Individuals intending to utilize the Reflective Laue Diffraction apparatus are required to possess certification in radiation environment safety training prior to engaging in instrument operation training.

1. Instrument: Reflective Laue Diffraction Instrument (Model: IPX-YGR-LC)
2. Instrument introduction: The instrument utilizes reflective Laue diffraction to analyze X-ray diffraction patterns, allowing inference of crystal structure and quality. It serves as a preliminary tool for assessing the quality of crystalline materials. When integrated with SingleCrystal software, it provides detailed crystallographic information such as crystal axis direction and texture.
3. Instrument properties:
   • Environmental Conditions: Atmospheric pressure, room temperature
   • Sample Type: Bulk materials
   • Image Plate Size: 8 cm x 12 cm
   • Beam Diameter: 0.5 mm
4. Fees: No charges are applicable for instrument usage.