XRD Shared Facility

Contact Person: 歐敏男 Ou, Min-Nan / oumn[at]gate.sinica.edu.tw / 886-2-2789-8991

Empyrean

Identifying the lattice structure of powders, bulks, and thin films by X-Ray diffractometer.

X'Pert³ MRD

Determination of the fine structure. Mainly identifying the diffraction signal of the surface material, and identifying the crystal orientation.