原子力顯微鏡AFM (Atomic Force Microscopy)
| 原子力顯微鏡可提供在x-y平面具有奈米解析度在z軸上有埃米解析度的樣品表面形貌。 註：掃描探針為耗材，使用者需自備。 |
| AFM provides surface morphology of sample with nanometer scale resolution in x-y plane and angstrom resolution in z-axis. PS. Scanning probes are consumable goods users have to bring their own. |
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Wei-Chiao Lai
Institute of Physics, Academia Sinica
128 Academia Road, Sec. 2, Nankang, Taipei 11529, Taiwan
Tel: 886-2-27898359