掃描電子顯微鏡SEM (Scanning Electron Microscopy)
| 掃描電子顯微鏡提供奈米尺度解析度的影像。適合的材料為塊材狀導體，非導體、粉末狀、鐵磁性材料均不可使用本設備觀察。 |
| SEM provides images with nanometer scale resolution. Conductive bulk sample is suitable for imaging. Non-conductive, powdered and ferromagnetic material are forbidden. |
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Wei-Chiao Lai
Institute of Physics, Academia Sinica
128 Academia Road, Sec. 2, Nankang, Taipei 11529, Taiwan
Tel: 886-2-27898359