An integrated system, including Metal Molecular Beam Epitaxy (MBE), Angle-Resolved Photoelectron Spectroscopy (ARPES), and Ultra-High Vacuum Scanning Probe Microscopy (UHV SPM), will be offered by Institute of Physics, Academia Sinica for growing and characterizing emergent crystal materials. This system provides a controllable environment to enable real-time on-site analyses after crystal growth, so that the design and fabrication of functional crystal materials can be achieved with high efficiency.


中央研究院物理研究所將提供一個集成系統,包括金屬分子束外延 (MBE)、角分辨光電子能譜 (ARPES) 和超高真空掃描探針顯微鏡 (UHV SPM),用於生長和表徵新穎晶體材料。 該系統提供了一個可控的環境,可以實現晶體生長後的即時臨場分析,從而高效地實現功能晶體材料的設計和製造。

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