胡恩德 (已離職)
En-Te Hwu

• 研究副技師

學 / 經歷

• 台灣大學機械工程研究所博士（2006）
• 清華大學動力機械系 兼任助理教授
• 德國聯邦物理學院 訪問學者
• 中央研究院物理所研究副技師

研究領域

• 奈米級定位系統
• 掃描探針顯微術
• 像散式量測系統

研究興趣與成果

En-Te Hwu has engineering background, he mainly focuses on instrumentation. He cooperates with PIs at Institute of Physics, Academia Sinica and builds custom made nano scale measurement/nano scale positioning systems for cutting edge experiments. En-Te Hwu builds an atomic resolution optical detection system which based on a DVD optical pick-up unig. This optical detection system called astigmatic detection system (ADS). The ADS has been widely used in homemade atomic force microscope (AFM), optical profiler, MEMS/NEMS vibrometers. Another important part for nano-scale instrumentations is nanopositioning system, En-Te Hwu built a new mechanism for driving pirzoelectric nanopositioner. There are many PIs adopt the homemade nanopositioning system for nano-scale X-ray microscops, micro-spotter system, multi-probe inspection system, long-time cell tracing systems. :

The itemized research accomplishments since 2009 are as follows:

A. ADS based nano-scale resolution optical vibrometer（For IoP PI: Hwang, Ing-Shouh）
B. ADS based optical profiler（For IoP PI: Hwang, Ing-Shouh）
C. ADS based platform for cantilever based Biosensors (BioDisk)
D. Coaxial optical imaging system（For IoP PI: Liou, Yung）
E. Blu-ray OPU based astigmatic detection system（For IoP PI: Hwang, Ing-Shouh）
F. Blu-ray OPU based quantum dot (QD) measurement system
G. OPU based light spectrum measurement system
H. OPU based Doppler interferometer multi-axis measurement system
I. Basic research version astigmatic AFM（2010 Nano education project in Abu Dhabi）
J. Education version astigmatic AFM（For IoP PI: Hwang, Ing-Shouh）
K. Astigmatic AFM combined with commercial optical microscope （For IoP PI: Hwang, Ing-Shouh）
L. Development of Astigmatic liquid AFM（For IoP PI: Hwang, Ing-Shouh）
M. Automation palm size astigmatic AFM（For IoP PI: Hwang, Ing-Shouh）
N. Miniature automated astigmatic AFM
O. Blu-ray OPU based astigmatic high speed AFM（For IoP PI: Hwang, Ing-Shouh）

Nanopositioner based instrumentations:

A. XYZ nano-scale resolution positioner（For IoP PI: Hwang, Ing-Shouh）
B. Compact XYZ nano-scale resolution positioner
C. Super long range (200mm) nano-scale resolution positioner
D. High stiffness piezo motor based rotation stage （For IoP PI: Hwang, Ing-Shouh）
E. Central aperture XYZ long range nano-scale resolution positioner
F. Central aperture XYZ long range nano-scale resolution positioner II
G. Portable X-ray microscope（For IoP PI: Hwu, Yu-Kuang）
H. 6 probes nano probing system (For IoP PI Lee, Wei-Li)
I. Long time bio molecular automation measurement system（For IoP PI: Chou, Chia-Fu）
J. 7 axes nano manipulation system （For IoP PI: Hwu, Yu-Kuang）
K. Multi-axis nanoscale linear/rotation system （For IoP PI: Hwu, Yu-Kuang）

Selected Recent Publications

1. “Low-Voltage and High-Performance Buzzer-Scanner Based Streamlined Atomic Force Microscope System,” En-Te Hwu et al., Nanotechnology Nov 15;24 (45):455503(2013)
2. "Design and characterization of a compact nano-positioning system for a portable transmission x-ray microscope'', En-Te Hwu et al., Review of Scientific Instruments, Dec;84(12):123702(2013).
3. "High-performance spinning device for DVD-based micromechanical signal transduction", En-Te Hwu et al., Journal of Micromechanics and Microengineering, 23 045016(2013).
4. "Real-time detection of linear and angular displacements with a modified DVD optical head", En-Te Hwu et al., Nanotechnology (SCI), Vol. 19, No. 115501(2008)
5. "Simultaneous detection of translational and angular displacements of micromachined elements", En-Te Hwu et al., Applied Physics Letters, Vol. 91, No. 221908(2007).